The manual heavily emphasizes the Waveform Table. The WFT links the vector symbols to actual physical time. For example, symbol 1 can be defined to transition from low to high at exactly 5 nanoseconds into a 10-nanosecond test cycle. 4. Writing Test Methods (API and Coding)
What specific or test type (e.g., Continuity, Leakage, RF, Memory) are you trying to program? Share public link
Load the (.bin/.vec) which contains the functional vectors.
Disclaimer: This article is for informational purposes based on publicly available information. Always refer to the official Advantest documentation provided with your equipment.
When the tester halts, the manual's troubleshooting and diagnostics section is your best friend. advantest 93k tester manual
Print the "Quick Reference Command Card" (if you can find it). Keep the PDF manual open only for the "Hardware Architecture" chapter. For everything else, ask your local Advantest FAE—they know that the manual is technically correct but practically useless for workflow.
: Used to characterize device margins by sweeping two parameters (e.g., Voltage vs. Frequency).
High-frequency instruments (like the WaveScale series) designed for testing Wi-Fi, 5G, and high-speed analog converters. Software Infrastructure (SmarTest)
The Advantest V93000 (93k) is the semiconductor industry's leading automated test equipment (ATE) platform for system-on-chip (SoC) and mixed-signal devices. Operating this platform efficiently requires a deep understanding of its hardware architecture, the SmarTest software environment, and standard calibration procedures. The manual heavily emphasizes the Waveform Table
Defines the clock periods, drive edges, and strobe windows for digital functional testing. Levels Files (.lev): Establishes the operating voltages ( VIHcap V sub cap I cap H end-sub VILcap V sub cap I cap L end-sub VOHcap V sub cap O cap H end-sub VOLcap V sub cap O cap L end-sub ) and current limits for the device pins.
Ensure the liquid cooling system is active and operating within nominal pressure and temperature ranges. Turn on the main infrastructure crate circuit breakers.
Extends the tester's capability to microwave frequencies. It enables complete characterization of Wi-Fi, Bluetooth, and 5G transceiver sub-circuits. 3. The SmarTest Software Environment
Object-oriented database. Everything is a reusable object. Disclaimer: This article is for informational purposes based
The pattern compiler output (.bin) does not match the active digital configuration.
settings match specs and check for short circuits on the DIB. Setup/hold timing issues or faulty chip logic.
Specific procedures to safely boot and shut down the test computer and mainframes. B. Maintenance
Without reading the hardware manual, engineers risk exceeding voltage limits or misconfiguring pin electronics, which can damage both the tester and the device under test (DUT).
The V93000 platform is modular, consisting of various card cages and pogo blocks to interface with the Device Under Test (DUT).